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Showing results: 31 - 45 of 47 items found.

  • SQUID Series Arrays

    Magnicon GmbH

    The SQUID series arrays are ideal for readout of TES sensors or as amplifier stage for discrete two-stage applications. Integrated bias resistors for TES or two-stage applications reduce wiring complexity. Various arrays with input inductances of 3 to 6 nH, input sensitivities of 17 to 23 µA/Phi0, and a current noise between 5 and 10 pA/sqrt(Hz) @ 4 K are available.

  • Micro probes 1 MHz up to 1 GHz

    MFA 02 set - Langer EMV-Technik GmbH

    The two in the set included micro probes are used to measure low-frequency magnetic fields up to 1 GHz, e.g. at signal conductors (150µm), SMD componets (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the BT 706 Bias tee. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee to a spectrum analyzer or an oscilloscope. The MFA 02 set delivery of Langer EMV-Technik GmbH includes correction lines. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.

  • 50Hz-100kHz LCR Meter

    11022/11025 - Chroma Systems Solutions, Inc.

    0.1% basic accuracyTransformer test parameters (11025), Turns Ratio, DCR, Mutual Inductance0Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz, 100kHz test frequencies21ms measurement time (≥100Hz)Agilent 4263B LCR Meter commands compatible4 different output resistance modes selectable for non-linear inductor and capacitor measuringHigh resolution in low impedance(0.01mΩ) and high accuracy 0.3% till 100mΩ rangeAdjustable DC bias current up to 200mA (constant 25Ω) (11025)1320 Bias Current Source directly control capability0.01mΩ ~ 99.99MΩ wide measurement range (4 1/2 digits)Dual frequency function (11022 option) for automatic productionBIAS comparator functionComparator function and 8/99 bin-sorting functionPass/fail judge result for automatic productionHandler interface trigger edge (rising/falling) programmableTest signal level monitor functionStandard RS-232, GPIB, and Handler I/FOpen/short zeroing, load correctionLabView® Driver

  • JFET Input Amplifiers

    Analog Devices Inc.

    Analog Devices JFET input op amps or FastFET high speed (>50 MHz) input op amps provide high input impedance and ultralow input bias currents for high speed applications. The majority of our FET input op amps feature wide supply ranges from +5 V to 12 V or higher and feature rail-to-rail outputs enabling wide dynamic range.

  • Laser Diode Drivers

    Arroyo Instruments

    Arroyo Instruments offers a broad range of laser drivers to meet your exact test needs. From 100 milliamps to 100 Amps, all of Arroyo Instruments' LaserSource benchtop laser drivers include unique features not found on competing products such as optically isolated photodiode and modulation inputs, programmable PD bias, and both RS232 and USB computer interfaces. The LaserSource also has laser diode protection circuits such as interlock, ESD protection, and hardware limits for current and voltage.

  • Versatile quality control testing system

    QuickSun® 550Ei - Endeas Oy

    QuickSun 550Ei is a versatile testing system for qualifying of PV modules with dimensions up to 105 x 205 cm2. Basic set up includes a top class solar simulator which measures modules in sunny side up position enabling e.g. soiling simulations. Several additional measurement methods can be integrated to the same system including high resolution EL imaging with analysis software from one of the most recognized EL system suppliers. Also hot spot revealing IR images can be recorded by applying either forward or reverse bias current, and true nA scale leakage current measurements can be performed with sensitive enough instruments.

  • Micro probes 1 MHz up to 6 GHz

    MFA 01 set - Langer EMV-Technik GmbH

    The micro probes are used to measure magnetic fields and they have a high resolution. They measure magnetic fields up to 6 GHz, e.g. at signal conductors (150µm), SMD components (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the Bias tee BT 706. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee BT 706 to a spectrum analyzer or an oscilloscope. Langer EMV-Technik GmbH includes correction lines in the delivery. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.

  • SPA100

    Electron Plus

    Our highly sensitive source picoammeter is designed for measuring and logging very small currents down to the pA range - making it an ideal instrument for scientific and research applications, including physics, materials science and electron microscopy. Full-featured at an affordable price, the SPA100 combines sensitivity, accuracy and stability to allow users to measure low currents with high precision as well as conveniently source bias voltages for experimentation. SPA100 also doubles as an ultra-high resistance meter, measuring accurately into the teraohm range. As with all our “headless” products, the SPA100 connects to PC via USB and utilises our complimentary software EPIC - enabling users to easily measure, graph and capture readings with timestamps and measurement stability information.

  • 8-CH 24-Bit High-Resolution Dynamic Signal Acquisition Module

    PXIe-9529 - ADLINK Technology Inc.

    The ADLINK PXIe-9529 is a high-performance, high density, 8-CH analog input dynamic signal acquisition module. The PXIe-9529 features eight 24-bit simultaneously sampling analog input channels. The 24-bit sigma-delta ADC provides a sampling rate of 192 kS/s at high resolution, making it ideal for higher dynamic range signal measurement. All channels are sampled simultaneously and accept input range up to ??10V, and the analog inputs support software-selectable AC or DC coupling and 4 mA bias current for integrated electronic piezoelectric (IEPE) sensors. The module is especially designed to meet the requirements of vibration analysis and audio testing.

  • 8-CH 24-Bit High-Resolution Dynamic Signal Acquisition Module

    PCIe-9529 - ADLINK Technology Inc.

    The ADLINK PCIe/PXIe-9529 is a high-performance, high density, 8-CH analog input dynamic signal acquisition module. The PCIe/PXIe-9529 features eight 24-bit simultaneously sampling analog input channels. The 24-bit sigma-delta ADC provides a sampling rate of 192 kS/s at high resolution, making it ideal for higher dynamic range signal measurement. All channels are sampled simultaneously and accept input range up to ±10V, and the analog inputs support software-selectable AC or DC coupling and 4 mA bias current for integrated electronic piezoelectric (IEPE) sensors. The module is especially designed to meet the requirements of vibration analysis and audio testing.

  • Resistors

    Vishay Intertechnology, Inc.

    A passive two-terminal electrical component that implements electrical resistance as a circuit element. In electronic circuits, resistors are used to reduce current flow, adjust signal levels, to divide voltages, bias active elements, and terminate transmission lines, among other uses. High-power resistors that can dissipate many watts of electrical power as heat may be used as part of motor controls, in power distribution systems, or as test loads for generators. Fixed resistors have resistances that only change slightly with temperature, time or operating voltage. Variable resistors can be used to adjust circuit elements (such as a volume control or a lamp dimmer), or as sensing devices for heat, light, humidity, force, or chemical activity.

  • Military-Style DC Solid-State Relay for High-Current Pulse Load Applications

    Part No. M33-2N - Teledyne Defense Electronics Relays & Coax Switch

    The M33-2N is a military-style DC solid-state relay designed for high-current pulse load applications. It features the latest power FET output technology to minimize ON resistance. This feature provides minimum output voltage drop and allows the M33-2N to switch high pulse currents up to 100 amps at higher temperatures than those allowable with bipolar devices. The M33-2N utilizes transformer isolation to protect against transients, and are through-hole mountedMSL 1 Available options include:M33-2 7Adc, 60Vdc Load; 4.5-5.5Vdc (bias voltage), 80µA (CMOS) Control;

  • Passive Component ATS

    Chroma ATE Inc.

    Test and packing speeds from 80ppm to1,800ppmStandard functions - Inductance/quality factor test - Winding resistance test - Polarity testOptional functions - Layer short test - Insulation resistance test - Bias current testCircular vibrating plate design feeds inductors steadily and rapidlyIndex disc design eliminates dropped inductorsFour-wire measurement test socket designAutomatic discharge mechanism when feeding errors occurEach test station has an independent NG (No Good) product collection boxTest without packaging function provided, good products gathered in bulk collection boxExclusive data collection software designed for monitoring product quality in real timeReserved stations for number spraying and automatic optical inspectionSwitchable Chinese/English/Japanese operating interfaceEquipment is fast, stable and safe

  • Surface Insulation Resistance Testing (SIR Testing)

    National Technical Systems

    Surface Insulation Resistance (SIR), as defined by IPC, is the electrical resistance of an insulating material between a pair of contacts, conductors, or grounding devices that is determined under specified environmental and electrical conditions.In respect to the world of printed circuit boards (PCBs) and printed circuit assemblies (PCAs), SIR testing—also commonly referred to as Temperature Humidity Bias (THB) testing—is used to evaluate a product’s or a process’ ability to resist “failure” by means of current leakage or an electrical short (i.e., dendritic growth). SIR testing is typically performed under elevated temperature and humidity conditions—such as 85°C/85% RH and 40°C/90%—with periodic insulation resistance (IR) measurements obtained.

  • Automatic Component Analyzer

    TH2829A - Changzhou Tonghui Electronic Co., Ltd.

    By dint of leading impedance measurement technology and rich R&D experience, Tonghui continuously introduces representative impedance measurement product --- TH2829 series automatic component analyzer is another excellent product we have produced. TH2829A automatic component analyzer possesses a higher test speed, a more comprehensive analysis function and friendly human-computer interactive experience by adopting the latest high-speed processor and a new software system. Well-designed measuring circuit and optimized algorithms further enhance the test stability of low-D capacitance and high-Q inductors. The instrument is provided with 10V AC test level, 10V/100mA bias current and standalone 10V/50mA DC current, making it convenient for applying in the test of all kinds of active/ passive devices. Main/ sub parameters display, enhanced display system design, 150-points list sweep and graphical analysis capabilities of multiple parameters meet the most application requirements of customers.

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